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Multi-Chip Module Test Strategies - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1997 edition
Multi-Chip Module Test Strategies - Frontiers in Electronic Testing
This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
167 pages, biography
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 04. októbra 2012 |
| ISBN13 | 9781461377986 |
| Vydavatelia | Springer-Verlag New York Inc. |
| Strany | 167 |
| Rozmery | 150 × 220 × 10 mm · 369 g |
| Jazyk | Angličtina |
| Editor | Zorian, Yervant |