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High Performance Gan Light-emitting Diode: a Reliability Study Zonglin Li
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Očakávané doručenie 9. - 19. okt
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High Performance Gan Light-emitting Diode: a Reliability Study
Zonglin Li
The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 17. mája 2011 |
| ISBN13 | 9783844395297 |
| Vydavatelia | LAP LAMBERT Academic Publishing |
| Strany | 80 |
| Rozmery | 150 × 5 × 226 mm · 137 g |
| Jazyk | Nemčina |
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