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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Peter Pichler Softcover reprint of the original 1st ed. 2004 edition
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 01. novembra 2012 |
| ISBN13 | 9783709172049 |
| Vydavatelia | Springer Verlag GmbH |
| Strany | 554 |
| Rozmery | 178 × 254 × 30 mm · 1,01 kg |
| Jazyk | Angličtina |
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