Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics - Peter Pichler - Books - Springer Verlag GmbH - 9783709172049 - November 1, 2012
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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition

Peter Pichler

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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics Softcover reprint of the original 1st ed. 2004 edition

This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.

554 pages, 40 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 1, 2012
ISBN13 9783709172049
Publishers Springer Verlag GmbH
Pages 554
Dimensions 178 × 254 × 30 mm   ·   1.01 kg
Language English  
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