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Ellipsometry at the Nanoscale Softcover reprint of the original 1st ed. 2013 edition
Ellipsometry at the Nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials.
730 pages, XXIV, 730 p.
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 23. augusta 2016 |
| ISBN13 | 9783662519714 |
| Vydavatelia | Springer-Verlag Berlin and Heidelberg Gm |
| Strany | 730 |
| Rozmery | 235 × 155 × 43 mm · 1,11 kg |
| Jazyk | Nemčina |
| Editor | Hingerl, Kurt |
| Editor | Losurdo, Maria |
Vianočné darčeky je možné vrátiť do 31. januára