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Multi-run Memory Tests for Pattern Sensitive Faults Ireneusz Mrozek 1st ed. 2019 edition
Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 18. júla 2018 |
| ISBN13 | 9783319912035 |
| Vydavatelia | Springer International Publishing AG |
| Strany | 135 |
| Rozmery | 150 × 220 × 20 mm · 454 g |
| Jazyk | Francúzština |