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Quantum Metrology, Imaging, and Communication - Quantum Science and Technology David S. Simon Softcover reprint of the original 1st ed. 2017 edition
Quantum Metrology, Imaging, and Communication - Quantum Science and Technology
David S. Simon
This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
273 pages, 40 Tables, color; 68 Illustrations, color; 37 Illustrations, black and white; XII, 273 p.
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 04. júla 2018 |
| ISBN13 | 9783319835402 |
| Vydavatelia | Springer International Publishing AG |
| Strany | 273 |
| Rozmery | 150 × 220 × 10 mm · 408 g |
| Jazyk | Nemčina |
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