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X-Ray Structure Analysis Theo Siegrist
X-Ray Structure Analysis
Theo Siegrist
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals.
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 22. novembra 2021 |
| ISBN13 | 9783110610703 |
| Vydavatelia | De Gruyter |
| Strany | 250 |
| Rozmery | 170 × 240 × 13 mm · 498 g |
| Jazyk | Angličtina |