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CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings
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CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155 - MRS Proceedings
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
179 pages, illustrations
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 19. novembra 2009 |
| ISBN13 | 9781605111285 |
| Vydavatelia | Materials Research Society |
| Strany | 194 |
| Rozmery | 160 × 236 × 18 mm · 432 g |
| Jazyk | Angličtina |
| Editor | Butterbaugh, Jeffery W. |
| Editor | Demkov, Alexander A. (University of Texas, Austin) |
| Editor | Harris, H. Rusty (Texas A & M University) |
| Editor | Rachmady, Willy |
| Editor | Taylor, Bill |
