X-Ray Diffraction: A Practical Approach - C. Suryanarayana - Knihy - Springer-Verlag New York Inc. - 9781489901507 - 06. júna 2013
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X-Ray Diffraction: A Practical Approach Softcover reprint of the original 1st ed. 1998 edition

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€ 159,99

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Očakávané doručenie 27. júl - 4. aug
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In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data.
Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it.
Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.


286 pages, biography

Médium Knihy     Paperback Book   (Kniha s mäkkou väzbou a lepeným chrbtom)
Vydané 06. júna 2013
ISBN13 9781489901507
Vydavatelia Springer-Verlag New York Inc.
Strany 273
Rozmery 155 × 235 × 15 mm   ·   408 g
Jazyk Angličtina  

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