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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Joseph Goldstein Third Edition 2003 Edition
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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Joseph Goldstein
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.
709 pages, biography
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 31. januára 2003 |
| ISBN13 | 9780306472923 |
| Vydavatelia | Springer Science+Business Media |
| Strany | 689 |
| Rozmery | 178 × 255 × 38 mm · 1,68 kg |