Electron Beam Lithography Process Optimization - Linfei Gu - Knihy - GRIN Verlag - 9783656083160 - 18. decembra 2011
V prípade, že obal a názov nesedia, platí názov

Electron Beam Lithography Process Optimization

Cena
€ 17,99

Objednané zo vzdialeného skladu

Očakávané doručenie 4. - 12. jún
Pridať do vášho zoznamu prianí na iMusic

Technical Report from the year 2011 in the subject Design (Industry, Graphics, Fashion), grade: -, University of Southern California, language: English, abstract: Currently, nanowires have aroused intensive attention due to their interesting electric and optical properties as well as potentially wide application (For example, nanowires can be used as a promising structure for transistor channels). For compound semiconductor nanowires, Nanoscale Selective Area MOCVD (Metalorganic Chemical Vapor Deposition), or NS?SAG, is a very attractive growth technique for the fabrication of sophisticated nanowire structure, because by using this technique, diameter and location of wires are controllable, with no incorporation of unwanted metals. It is achieved by deposition of a nano?openingarray ?patterned dielectric mask above the substrate. Since crystals cannot be formed on dielectric mask, nanowire growth only occurs at openings, with desired diameters and locations, as shown in Fig 1. Pattern of nano opening arrays is of vital importance since it governs the size, location and density of nanowires as wells as growth rate and behavior.

Médium Knihy     Paperback Book   (Kniha s mäkkou väzbou a lepeným chrbtom)
Vydané 18. decembra 2011
ISBN13 9783656083160
Vydavatelia GRIN Verlag
Strany 36
Rozmery 138 × 2 × 213 mm   ·   45 g
Jazyk Nemčina