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Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2009 edition
Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology
Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.
279 pages, 14 black & white tables, biography
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 22. novembra 2010 |
| ISBN13 | 9783642098703 |
| Vydavatelia | Springer-Verlag Berlin and Heidelberg Gm |
| Strany | 224 |
| Rozmery | 150 × 220 × 10 mm · 429 g |
| Jazyk | Nemčina |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |