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Applied Scanning Probe Methods: Characterization - Nanoscience and Technology Donna R. Kemp 1st edition
Applied Scanning Probe Methods: Characterization - Nanoscience and Technology
Donna R. Kemp
Presents 10 chapters on a variety of techniques and refinements of Scanning Probe Methods (SPM) applications.
338 pages, 7 black & white tables, biography
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 18. októbra 2006 |
| ISBN13 | 9783540373186 |
| Vydavatelia | Springer-Verlag Berlin and Heidelberg Gm |
| Strany | 338 |
| Rozmery | 155 × 235 × 19 mm · 648 g |
| Jazyk | Angličtina |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |
| Editor | Kawata, Satoshi |
Vianočné darčeky je možné vrátiť do 31. januára