Povedzte o tejto položke priateľom:
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Bharat Bhushan 2006 Edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
Bharat Bhushan
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 22. februára 2006 |
| ISBN13 | 9783540269090 |
| Vydavatelia | Springer-Verlag Berlin and Heidelberg Gm |
| Strany | 378 |
| Rozmery | 166 × 243 × 21 mm · 716 g |
| Jazyk | Nemčina |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |
Vianočné darčeky je možné vrátiť do 31. januára