Microelectronic Manufacturing Yield Reliability - Hartmann - Books - SPIE Press - 9780819426482 - June 30, 2006
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Microelectronic Manufacturing Yield Reliability


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198 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 30, 2006
ISBN13 9780819426482
Publishers SPIE Press
Pages 198
Dimensions 150 × 220 × 10 mm   ·   441 g   (Weight (estimated))

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