Povedzte o tejto položke priateľom:
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications Greg Haugstad
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Greg Haugstad
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).
488 pages, Illustrations
| Médium | Knihy Hardcover Book (Kniha s pevnou väzbou a obalom) |
| Vydané | 16. októbra 2012 |
| ISBN13 | 9780470638828 |
| Vydavatelia | John Wiley & Sons Inc |
| Strany | 528 |
| Rozmery | 163 × 244 × 31 mm · 794 g |
| Jazyk | Angličtina |