Povedzte o tejto položke priateľom:
Advanced VLSI Design and Testability Issues 1. vydanie
Cena
€ 68,99
Objednané zo vzdialeného skladu
Očakávané doručenie 3. - 17. júl
Naši zákazníci hovoria:
Pridať do vášho zoznamu prianí na iMusic
Tiež dostupné ako:
Advanced VLSI Design and Testability Issues
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.
360 pages, 29 Tables, black and white; 192 Illustrations, black and white
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 15. apríla 2022 |
| ISBN13 | 9780367538361 |
| Vydavatelia | Taylor & Francis Ltd |
| Strany | 360 |
| Rozmery | 154 × 234 × 35 mm · 570 g |
| Jazyk | Angličtina |
| Editor | Mohapatra, Sushanta Kumar (Kalinga Institute of Industrial Technology, India.) |
| Editor | Saxena, Sobhit (Lovely Professional University University, India.) |
| Editor | Tripathi, Suman Lata (Lovely Professional University, India) |
