Advanced VLSI Design and Testability Issues -  - Knihy - Taylor & Francis Ltd - 9780367492823 - 19. augusta 2020
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Advanced VLSI Design and Testability Issues 1. vydanie

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This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.


360 pages, 29 Tables, black and white; 192 Illustrations, black and white

Médium Knihy     Hardcover Book   (Kniha s pevnou väzbou a obalom)
Vydané 19. augusta 2020
ISBN13 9780367492823
Vydavatelia Taylor & Francis Ltd
Strany 360
Rozmery 241 × 162 × 27 mm   ·   718 g
Jazyk Angličtina  
Editor Mohapatra, Sushanta Kumar (Kalinga Institute of Industrial Technology, India.)
Editor Saxena, Sobhit (Lovely Professional University University, India.)
Editor Tripathi, Suman Lata (Lovely Professional University, India)

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