VLSI Design and Test -  - Knihy - Springer Verlag, Singapore - 9789811074691 - 22. decembra 2017
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VLSI Design and Test 1st ed. 2017 edition

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€ 101,49

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Očakávané doručenie 23. jún - 1. júl
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.


815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.

Médium Knihy     Book
Vydané 22. decembra 2017
ISBN13 9789811074691
Vydavatelia Springer Verlag, Singapore
Strany 815
Rozmery 150 × 220 × 20 mm   ·   1,25 kg
Editor Dasgupta, Sudeb
Editor Kaushik, Brajesh Kumar
Editor Singh, Virendra

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