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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 12. februára 2010 |
| ISBN13 | 9783642065965 |
| Vydavatelia | Springer-Verlag Berlin and Heidelberg Gm |
| Strany | 378 |
| Rozmery | 155 × 235 × 21 mm · 639 g |
| Jazyk | Nemčina |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |