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Helium Ion Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2016 edition
Helium Ion Microscopy - NanoScience and Technology
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.
526 pages, 100 Tables, color; 204 Illustrations, color; 116 Illustrations, black and white; XXIII, 5
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 16. júna 2018 |
| ISBN13 | 9783319824734 |
| Vydavatelia | Springer International Publishing AG |
| Strany | 526 |
| Rozmery | 156 × 234 × 32 mm · 814 g |
| Jazyk | Nemčina |
| Editor | Golzhauser, Armin |
| Editor | Hlawacek, Gregor |