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Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology 2019 edition
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Electrical Atomic Force Microscopy for Nanoelectronics - NanoScience and Technology
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.
408 pages, 60 Tables, color; 230 Illustrations, color; 26 Illustrations, black and white; XX, 408 p.
| Médium | Knihy Paperback Book (Kniha s mäkkou väzbou a lepeným chrbtom) |
| Vydané | 25. augusta 2020 |
| ISBN13 | 9783030156145 |
| Vydavatelia | Springer Nature Switzerland AG |
| Strany | 408 |
| Rozmery | 150 × 220 × 10 mm · 652 g |
| Jazyk | Nemčina |
| Editor | Celano, Umberto |
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